Molecular Electronics: Volume 582Sokrates T. Pantelides Cambridge University Press, 19 січ. 2001 р. - 138 стор. In conventional microelectronics, devices are fabricated by lithographic processes. Ultimately, for devices with feature lengths below 100nm, alternative approaches may become necessary. This book focuses on materials issues that relate to the fabrication of nanoelectronics in which the active regions of devices are either molecules or nanoparticles, and self-assembly replaces lithography. The volume is interdisciplinary in nature and features work by a diverse gathering of chemists, physicists, materials scientists and mainstream silicon engineers. Materials of interest include, but are not limited to, organic molecules, carbon nanotubes and semiconductor nanoclusters. |
Зміст
Materials Research Society Symposium Proceedings XX | 5 |
Artificial Atoms Of Silicon H2 | 6 |
Room Temperature Negative Differential Resistance | 6 |
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2000 Materials Research alkanethiol alumina template Appl atoms band bending behavior bias biopolymer calculated capacitance carbon nanotubes carrier CdSe chains charge Chem chemical Chemistry clusters colloid conductance Coulomb blockade current-voltage density deposition deposition chemistry Dept dipole dopant doped effect electrical electronic devices electronic structure energy level experimental fabrication Fermi level Figure function gold nanoparticles I-V characteristics ISBN layer Lett level alignment ligand luminescence M. S. Dresselhaus Materials Research Society measurements metal nanoparticles Molecular Electronics molecular wire molecule nanocrystals nanoparticles nanoscale observed optical organic oxide particles Phys plasmon polymer quantum dots R. M. Metzger resistance resonant tunneling room temperature sample self-assembled monolayer semiconductor shown silicon single electron solution spectra spectroscopy substrate surface synthesized Te-doped Bi nanowires technique thickness thin films thiol threshold voltage transport properties undoped vacuum level voltage Volume wire diameter X-ray photoelectron spectroscopy